February 26, 2014
If you were one of the thousands of engineers who attended the recent DesignCon Expo in Santa Clara, you no doubt came away with plenty of ideas and trends about all things high-speed serial. For us at Anritsu, the overall level of interest and participation in this key signal integrity topic was apparent both in the conference sessions and on the show floor.
Anritsu presented two conference papers and four technical sessions on various topics related to signal integrity. The VectorStar™ Vector Network Analyzer (VNA) took center stage in two of those presentations. A key topic in both cases was the criticality of high-quality low-frequency S-parameter data when simulating eye diagrams (figure 1).
Managing S-Parameter Data for 10 to 32 GB/S Time-Domain Simulations – Wild River Technology was a partner in this conference paper with Al Neves as a co-presenter. We covered various aspects of using VNAs for signal integrity applications, ranging from the nature of S-parameter data and calibrations, through establishment of simulation-measurement correspondence to establishment of a workflow to ensure capture of high-quality S-parameter data. There seemed to be much interest in this topic, as other papers that I attended touched on aspects of it and our session was well attended with standing room only for some audience members. Our paper on this topic is also listed as a “Best Paper Finalist.”
The Role of Improved Measurements and Tools in Assessing Simulation-Measurement Correspondence for 32 Gbps Systems – Wild River Technology also participated in this joint presentation geared towards signal integrity engineers. The presentation focused on things to consider when making measurements on signals operating at these high speeds, including the importance of the extent of the frequency range at low- and high-end of S-parameter measurements, and how this affects achieving correlation between simulation and measurement.
Show Floor Activity
VectorStar and measuring high-speed signals were of great interest on the show floor, as well. Our innovative VNA was in action with the Wild River Technology Channel Modeling Platform (figure 2) – keeping with the theme of simulation-measurement correspondence. We also demonstrated the VectorStar making measurements on a differential amplifier showcasing Internal Second Source and DifferentialView™ options for true mode stimulus measurements.
In addition to these exhibits, VectorStar was featured in guest appearances in other exhibitor booths, including Wild River Technology (figure 3). The VNA was part of demonstrations covering probing, channel modeling and materials measurements.
I would personally like to thank all of the members of the design community who visited the Anritsu DesignCon booth or attended our presentations. For those of you that did not, I hope that this blog entry gives you a hint of what we were up to at DesignCon 2014. If your appetite is now whet and you need more, feel free to download our conference paper: Managing S-Parameter Data for 10 to 32 GB/S Time-Domain Simulations.